Poids de l’Open access dans la production CNRS
Home
Resources
Graphs
Search
Export
Sign in
Titre
Low-Frequency Noise Characterization in GaN HEMTs: Investigation of Deep Levels and Their Physical Properties
XX
BSO - Titre
Low-Frequency Noise Characterization in GaN HEMTs: Investigation of Deep Levels and Their Physical Properties
XX
DOI
DOI
10.1109/led.2017.2717539
XX
DOAI
DOAI
10.1109/led.2017.2717539
XX
Identifiant WoS
WOS:000406429600028
XX
Accès ouvert
OA - Non
XX
Source - Accès ouvert
OA - Non
XX
Type d'accès
Non OA
XX
Editeur
IEEE - Institute of Electrical and Electronics Engineers
XX
Source
IEEE ELECTRON DEVICE LETTERS
XX
ISSN
0741-3106
XX
Type de document
Article
XX
Notoriété
4 - Excellente
XX
CNRS
Oui
XX
CNRS - Institut
INSIS - Institut des sciences de l'ingénierie et des systèmes
XX
uid:/H91DV08M
12/10/2021 14:52:48 (latest)
Add field
Share/Export
Powered by
Lodex
9.6.0
